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Electronic Test Equipment Wide selection of equipment covering all of your measurement needs. LCR Meters. Digital Multimeters. Power Supplies. Function and Arbitrary Waveform Generators. Spectrum Analyzers. Engineering, Computer Science.

View 1 excerpt, references background. Jitter testing for multi-Gigabit backplane SerDes - techniques to decompose and combine various types of jitter. International Test Conference. IEEE Des. Test Comput. View 2 excerpts, references methods. Towards a standardized procedure for automatic test equipment timing accuracy evaluation. International Test Conference An approach to consistent jitter modeling for various jitter aspects and measurement methods.

Proceedings International Test Conference Cat. View 1 excerpt, references methods. A new method for jitter decomposition through its distribution tail fitting.

We present a new time-domain jitter separation method. Such a method automatically searches and fits the tail parts of the jitter histogram with nonlinear jitter models and estimates deterministic … Expand.

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